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Home » 2018 » April

Monthly Archive: April 2018

Ist, together with changan and unicore, announce the first AEC-Q100 Compliant car navigation chip

iST (Integrated Service Technology, Inc.), the leading electronic products testing and certification service provider, together with China’s dominating car manufacturer,

April 23, 2018 7:17 pm Comments Off on Ist, together with changan and unicore, announce the first AEC-Q100 Compliant car navigation chip admin Read More »

iST breaks through the barrier of 10nm in TEM material analysis technology

Keeping up with the semiconductor industry’s development in more advanced process, iST makes another breakthrough in Material Analysis! After a

April 23, 2018 7:15 pm Comments Off on iST breaks through the barrier of 10nm in TEM material analysis technology admin Read More »

NEWS- MCC HPB5C in iST

Good news from IST labs!!Besides the old MCC ABES-V that IST already has, we have now the MCC HPB5C at

April 23, 2018 7:11 pm Comments Off on NEWS- MCC HPB5C in iST admin Read More »

Provide WLCSP Backend turnkey service

Have you faced the yield issue and low thorough-put in WLCSP development? Who can handle the backend grinding, testing, saw

April 23, 2018 6:53 pm Comments Off on Provide WLCSP Backend turnkey service admin Read More »

HDR (High Dynamic Range) has become the standard of television specifications

HDR (High Dynamic Range) has become the standard of television specifications. As an engineer of display products, why discontinuous contour

April 23, 2018 6:37 pm Comments Off on HDR (High Dynamic Range) has become the standard of television specifications admin Read More »

iST has officially become a VESA authorized lab for test and certification of DisplayportTM and DisplayportTM over USB-CTM

iST has officially become a VESA authorized lab for test and certification of DisplayportTM and DisplayportTM over USB-CTM. The Display

April 23, 2018 6:30 pm Comments Off on iST has officially become a VESA authorized lab for test and certification of DisplayportTM and DisplayportTM over USB-CTM admin Read More »

For Abnormal High Resistance Value of the Device After Reliability Test

Computer simulation of device on-board stress-match is normal but the reliability test fails. Is this a device -PCB matching issue

April 23, 2018 5:48 pm Comments Off on For Abnormal High Resistance Value of the Device After Reliability Test admin Read More »
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